Utilizing Machine Learning to improve the accuracy of the semiconductor yield forecast in the production Line

Creators: Peri, Siva Sai Gowtham
Supervisor: Faußer, Stefan A.
Title: Utilizing Machine Learning to improve the accuracy of the semiconductor yield forecast in the production Line
Item Type: Thesis
Date: 11 October 2022
Divisions: Informationsmanagement
Forthcoming: No
Study Programme: Master - International Enterprise Information Management (EIM)
Language: English
Citation:

Peri, Siva Sai Gowtham (2022) Utilizing Machine Learning to improve the accuracy of the semiconductor yield forecast in the production Line. Master thesis, Hochschule Neu-Ulm.

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