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Alves, Hans and Unkelbach, Christian and Burghardt, Juliane and Koch, Alex S. and Krüger, Tobias and Becker, Vaughn D. (2015) A density explanation of valence asymmetries in recognition memory. Memory & Cognition, 43 (6). pp. 896-909. ISSN 0090-502X
Krüger, Tobias and Fiedler, Klaus and Koch, Alex S. and Alves, Hans (2014) Response Category Width as a Psychophysical Manifestation of Construal Level and Distance. Personality and Social Psychology Bulletin, 40 (4). pp. 501-512. ISSN 0146-1672